Optical and structural characterization of poly (aniline) (PANi) films obtained by spin-coating method

Authors

  • barhoumi zina Unité Physico-Chimie Des Matériaux Solides, Département de Chimie, Faculté des Sciences de Tunis, Campus Universitaire, 2092 El Manar
  • Noureddine Amdouni Unité Physico-Chimie Des Matériaux Solides, Département de Chimie, Faculté des Sciences de Tunis, Campus Universitaire, 2092 El Manar
  • Jean François Stumbé Laboratoire de Photochimie et d’Ingénierie Macromoléculaires, Université de Haute Alsace, 3rue A.werner 68093 Mulhouse cedex
  • Amalendu Pal Department of Chemistry, Kurukshetra University, Kurukshetra 136 119

Abstract

The structural and optical properties of the PANi films were investigated in terms of different solvent content by using X-ray diffraction (XRD), RAMAN spectroscopy, Scanning electron microscopy (SEM), Photoluminescence (PL) and optical absorption spectroscopy. The XRD results revealed that the crystallinity through films increased as the molar ratio of dimethylacetamide (DMAc and dimethylformamide (DMF) increased to 0.6:0.4, but then decreased when the molar ratio was increased from 0.6:0.4 to 0.8:0.2. It is shown that even small clusters in PANi films can explain the observed RAMAN scattering.  The results of the optical experiments showed that films prepared from different molar ratio of DMAc and DMF showed good near-infrared characteristic in the range of 800-2000 nm. The optical band gap value from absorption coefficient data is found to be 3.57 eV.    The SEM also showed changes in the morphology of PANi films.

References

- A.G. MacDiarmid, Angew. Chem. Int.2001, 40, 2581-2590.

- C.D. Dimitrakopoulos, P.R.L. Malenfant, Adv. Mater. 2002, 14, 99-117.

- S.Virji, R.B. Kaner, B.H. Weiller, Chem. Mater. 2005, 17, 1256-1260.

- S. Venkatachalam, P.V. Prabhakaran, Synth .Met. 1998, 97, 141-146.

- Z.M.Tahir, E.C. Alocilja, and D.L. Grooms, Sensor. 2007, 7, 1123-1140.

- L. Liang, J. Liu, C.F. Windisch, G.J. Exarhos, and Y. Lin, Angew.Chem. Int. 2002, 41, 3665-3668.

- L. F. He, Y. Jia, F. L. Meng, M. Q. Li, and J. H. Liu, Mater. Sci. Eng. 2009, 163, 76-81.

- Y. H. Lin, X. L. Cui, Chem. Commun. 2005, 2226-2228.

- M. Q. Li, L. H. Jing, Electrochim. Acta. 2007, 52, 3250-3257.

- V. Mottaghitalab, B. B. Xi, G. M. Spinks, and G. G. Wallace, Synth.Met. 2006, 156, 796-803.

- G. M. Spinks, V. Mottaghitalab, M. Bahrami-Saniani, P. G. Whitten, and G. G. Wallace, Adv. Mater. 2006, 18, 637-640.

- S. Ben-Valid, H. Dumortier, M. Decossas, R. Sfez, M. Meneghetti, A. Bianco, and S. Yitzchaik, J. Mater. Chem. 2010, 20, 2408-2417.

- P. C. Ramamurthy, A. M. Malshe , W. R. Harrell, R. V. Gregory, K. McGuire, and A. M. Rao, Solid State. Elect. 2004, 48, 2019-2024.

- J. H. Lim, N. Phiboolsirichit, S. Mubeen, M. A. Deshusses, A. Mulchandani, and N. V. Myung, Nanotech. 2010, 21, 075502.

- B. L. He, B. Dong, W. Wang, and H. L. Li, Mater. Chem. Phys. 2009, 114, 371-375.

- S. R. Sivakkumar , W. J. Kim, J.A. Choi, D. R. MacFarlane, M. Forsyth, and D.W. Kim, J.Power. So. 2007, 171, 1062-1068.

- S. Bhadra, D. Khastgir, N. Singha and J. Lee, Progress in Polym. Sci. 2009, 34, 783-810.

- S.G. Oh, B.J. Kim, M.G. Han, and S.S. Im, Synth. Met. 2001, 122, 297-304.

- X.G. Li, M.R. Huanga, J.F. Zeng, and M.F. Zhu, Colloids and Surfaces A: Physicochem. Eng. 2004, 248, 111-120.

- R. Sainz, A. M. Benito, M. T. Martinez, J. F. Galindo, J. Sotres, A. M. Baro, B. Corraze, O. Chauvet, A. B. Dalton, R. H. Baughman, and W. K. Maser, Nanotech. 2005, 16, 150-154.

- Y. F. Ma, S. R. Ali, L. Wang, P. L. Chiu, R. Mendelsohn and H.X. He, J. American Chem. Soc. 2006, 128, 12064-12065.

- N. Bohli, F. Gmati, A. B. Mohamed, V. Vigneras and J. L. Miane, J. Phys. D: Appl. Phys. 2009, 42, 205404.

- D. Prasanna, H. S. Jayanna, A.R. Lamani, M. L. Dinesha, C. S Naveen, and C. Shankaramurthy, J. Chin. Phys. Lett. 2011, 28, 7701.

- T. Rajavardhana Rao, I. Omkaram , K-V. Brahmam, Ch. Linga Raju, J. Mol. Struct. 2013, 1036, 94-101

- H. Klug, L. Alexander, Eds.; X-ray Diffraction Procedures, Wiley: New York, 1962, pp.125.

- E. A. Meulenkamp, J.Phys. Chem. B. 1998, 102, 5566-5572.

- M. Cochet, G. Louarn, S. Quillard, M-I. Boyer, J-P. Buisson, S. Lefrant, J. Raman Spectrosc. 2001, 11, 1029-39.

- I. Sedenkova, M. Trchova, J. Stejskal, Polym. Degrad. Stability, 2008, 93 , 2147-2157

- A. Uygun, L. Oksuz, A. G. Yavuz, A. Guleç, and S. Sen , Current App.Phys. 2011, 11, 250-254.

- K. Gopalakrishnan, C. Ramesh, M. Elango, and M. Thamilselvan, Mat. Sci. 2014, ID 567927.

- V. A. Khati, S. B. Kondawar, and V. A. Tabhane, Analytical & Bioanalytica Electrochem. 2011, 3, 614-624.

- F. S. Mehamod, R. Daik and A. Musa, Malaysia. J. Chem. 2002, 4, 35-40.

- Z. Jiali, W. Hao, Y. Shimei , W. Shaohui, Y. Shaoming , J. App. Polym. Sci. 2012, 125, 2494-2501.

- J .Stejskal, I .Sapurina, M .Trchova, Progress In Polym. Sci, 2010, 35, 1420-1481.

Downloads

Published

2016-05-15

Issue

Section

Physical Chemistry